Dr. Rajesh Langoju received his B.Tech in Electronics and Instrumentation engineering from Nagarjuna University in 2001, and M.Tech in Instrument technology from Dept. of
Instrumentation, Indian Institute of Science (IISc) Bangalore, India, in 2003. He obtained his PhD from Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland in 2006. He started his career with GE Global Research Centre, Bangalore INDIA in 2007. Presently he is working as Senior Staff Data Scientist in Advanced Technology Group, GE Healthcare Bangalore. He has published 21 papers in peer reviewed Journals, 7 Conference publications, 2 Book chapters, and filed 22 US patents. His research interests include Deep Learning methods for Computed Tomography Reconstruction, Inverse problems for Advanced Imaging Methods, Ultrasonic imaging, Electrical Impedance Tomography, Optical Tomography, Non-Destructive Imaging, Signal Processing/Analytics for Biomedical and Industrial Applications.
Instrumentation, Indian Institute of Science (IISc) Bangalore, India, in 2003. He obtained his PhD from Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland in 2006. He started his career with GE Global Research Centre, Bangalore INDIA in 2007. Presently he is working as Senior Staff Data Scientist in Advanced Technology Group, GE Healthcare Bangalore. He has published 21 papers in peer reviewed Journals, 7 Conference publications, 2 Book chapters, and filed 22 US patents. His research interests include Deep Learning methods for Computed Tomography Reconstruction, Inverse problems for Advanced Imaging Methods, Ultrasonic imaging, Electrical Impedance Tomography, Optical Tomography, Non-Destructive Imaging, Signal Processing/Analytics for Biomedical and Industrial Applications.
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