While there are many variations of an Inelastic X-ray Scattering (IXS) spectrometer, the figure of merit is often the energy resolution and the throughput. As part of the LCLS-II-HE project, the DXS team is developing a hard X-ray IXS spectrometer with a resolution of 5 meV at 11.215 keV. The spectrometer relies on a so-called post-sample-collimation scheme, and this high degree of resolution comes with stringent precision and stability requirements. SHADOWOui is used to simulate the setup and analyze the tolerance of 4 optics’ axis (translation, pitch, yaw, roll) and the miscut angle of the channel-cut crystal of the design. The simulation indicates that a 5 meV resolution is achievable by ensuring stringent pitch and vertical translation tolerances. Furthermore, the simulation suggests that a miscut angle of 77 degrees, which necessitates high-quality crystal manufacturing, is optimal.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.