NIST and multiple industrial stakeholders are leading and supporting multiple efforts to develop standards for 3D imaging systems for manufacturing automation applications. Many manufacturers specify the performance of their sensors in non-standard ways and offer no method to verify those parameters independently. The standards are being developed under the auspices of the ASTM E57 committee on 3D Imaging Systems. They are meant to produce a) standards for measuring the performance of 3D imaging systems, b) standards for bin-picking vision systems, and c) guidelines for the selection of 3D imaging systems. This work presents the status of four work items.
Structured light scanners have been commercially available for over a decade and some commercial scanners are evaluated using one of two German guidelines – VDI/VDE 2634 parts 2 and/or 3. Several other research groups have developed physical artifacts that are agnostic to instrument construction and are purpose driven. The use of such guidelines and artifacts is not well understood for instruments which have a variety of sensor configurations and capabilities. It is also not clear if these guidelines/artifacts are sensitive to all the sources of errors that are present in these systems. In this context, this paper will describe the ongoing activities at NIST to study various sources of errors in structured light scanners with an objective of characterizing their performance.
Conference Committee Involvement (6)
Dimensional Optical Metrology and Inspection for Practical Applications XIV
13 April 2025 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
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