Dr. Ping Zhong
at Donghua Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

Proceedings Article | 25 November 2009 Paper
P. Zhong, T.-T. Zhang, C.-J. Song
Proceedings Volume 7513, 751326 (2009) https://doi.org/10.1117/12.838027
KEYWORDS: High dynamic range imaging, Image enhancement, Image quality, Computing systems, Transmittance, Control systems, Image segmentation, Charge-coupled devices, Imaging systems, CCD image sensors

Proceedings Article | 20 November 2009 Paper
P. Zhong, Ye Jin
Proceedings Volume 7511, 751122 (2009) https://doi.org/10.1117/12.838210
KEYWORDS: Head, Sun, Silicon, Receivers, Computer programming, Measurement devices, Amplifiers, Sensors, Signal processing, Data processing

Proceedings Article | 31 August 2009 Paper
Ping Zhong, Nian Luo, Chen-jie Song
Proceedings Volume 7382, 73824F (2009) https://doi.org/10.1117/12.835601
KEYWORDS: Image enhancement, High dynamic range imaging, Associative arrays, Image compression, Image processing, Charge-coupled devices, Control systems, Digital image processing, Image quality, Computing systems

Proceedings Article | 27 November 2007 Paper
Jianxin Qiu, Liang Tan, Ping Zhong
Proceedings Volume 6723, 67232F (2007) https://doi.org/10.1117/12.783304
KEYWORDS: 3D image processing, 3D metrology, Microelectronics, 3D acquisition, 3D image reconstruction, Image processing, Moire patterns, Fringe analysis, Image analysis, Distortion

Proceedings Article | 27 November 2007 Paper
Ping Zhong, Jianxin Qiu
Proceedings Volume 6723, 67233X (2007) https://doi.org/10.1117/12.783575
KEYWORDS: Moire patterns, Image enhancement, Image filtering, Image processing, Fringe analysis, Detection and tracking algorithms, Digital image processing, 3D image processing, Binary data, Digital filtering

Showing 5 of 6 publications
Conference Committee Involvement (9)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Showing 5 of 9 Conference Committees
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