Dr. Peter B. Catrysse
Sr. Research Engineer at Stanford Univ
SPIE Involvement:
Author | Instructor
Publications (28)

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12432, PC124320A (2023) https://doi.org/10.1117/12.2647788
KEYWORDS: Polarization, CMOS sensors, Image sensors, Optical filters, Optical properties, Numerical simulations

Proceedings Article | 5 September 2019 Presentation + Paper
Proceedings Volume 11080, 110801W (2019) https://doi.org/10.1117/12.2527212
KEYWORDS: Polarization, Metamaterials, Scattering, Magnetism, Rayleigh scattering, Light scattering, Wave propagation, Electromagnetic scattering, Anisotropy

Proceedings Article | 14 March 2018 Presentation
Proceedings Volume 10541, 105411A (2018) https://doi.org/10.1117/12.2291114
KEYWORDS: Polarization, Imaging spectroscopy, Multispectral imaging, Photonic crystals, Infrared imaging, Infrared radiation, Polarimetry, Metals, Imaging systems, Plasmonics

Proceedings Article | 13 May 2015 Paper
Proceedings Volume 9481, 948102 (2015) https://doi.org/10.1117/12.2180177
KEYWORDS: Optical filters, Integrated optics, Image sensors, Imaging systems, Nanofabrication, Mid-IR, Infrared imaging, CMOS technology, Image filtering, Optical components

Proceedings Article | 14 March 2015 Paper
Proceedings Volume 9361, 936112 (2015) https://doi.org/10.1117/12.2081040
KEYWORDS: Diffraction, Anisotropy, Metamaterials, Electromagnetism, Structured photonic materials, Waveguides, Lenses, Radio propagation, Interfaces, Nanofabrication

Proceedings Article | 22 February 2012 Paper
Proceedings Volume 8269, 82690X (2012) https://doi.org/10.1117/12.909576
KEYWORDS: Transparency, Electromagnetism, Calcium, Metamaterials, Free space, Photonic nanostructures, Electromagnetic scattering, Scattering, Magnetism, Resonators

Proceedings Article | 11 September 2010 Paper
Proceedings Volume 7757, 775724 (2010) https://doi.org/10.1117/12.860998
KEYWORDS: Electrodes, Transmittance, Metals, Resistance, Optical properties, Polarization, Thin films, Physics, Oxides, Magnetism

SPIE Journal Paper | 1 April 2010 Open Access
JEI, Vol. 19, Issue 02, 021101, (April 2010) https://doi.org/10.1117/12.10.1117/1.3459944
KEYWORDS: Digital photography, Digital cameras, Cameras, Imaging systems, Image sensors, Photography, Computational imaging, Sensors, Image processing, Electronic imaging

Proceedings Article | 12 February 2010 Paper
Proceedings Volume 7604, 76040O (2010) https://doi.org/10.1117/12.842692
KEYWORDS: Waveguides, Gold, Dispersion, Geometrical optics, Metals, Dielectrics, Wave propagation, Integrated optics, Plasmonics, Near field optics

Proceedings Article | 26 January 2010 Paper
Guillaume Leseur, Nicolas Meunier, Georgios Georgiadis, Lily Huang, Jeffrey DiCarlo, Brian Wandell, Peter Catrysse
Proceedings Volume 7536, 75360A (2010) https://doi.org/10.1117/12.840325
KEYWORDS: Sensors, CMYK color model, Sensing systems, Computing systems, Reflectivity, Printing, Computer simulations, Error analysis, CCD image sensors, Statistical analysis

Proceedings Article | 3 September 2009 Paper
Proceedings Volume 7394, 73940B (2009) https://doi.org/10.1117/12.826662
KEYWORDS: Lenses, Gold, Confocal microscopy, Metals, Plasmonics, Microlens, Ion beams, Silica, Scanning electron microscopy, Magnetism

Proceedings Article | 19 January 2009 Paper
Proceedings Volume 7250, 72500K (2009) https://doi.org/10.1117/12.806616
KEYWORDS: Cameras, Imaging systems, Sensors, Zoom lenses, Image quality, Spatial resolution, Signal to noise ratio, Modulation transfer functions, Diffraction, Image sensors

Proceedings Article | 19 January 2009 Paper
Proceedings Volume 7250, 72500G (2009) https://doi.org/10.1117/12.807011
KEYWORDS: Imaging systems, Objectives, Modulation transfer functions, CMOS sensors, Microlens, Finite-difference time-domain method, Image resolution, Dielectrics, Photodiodes, Optical filters

Proceedings Article | 19 January 2009 Paper
Proceedings Volume 7250, 725005 (2009) https://doi.org/10.1117/12.807007
KEYWORDS: Microlens, Dielectrics, Optical filters, CMOS sensors, Diffraction, Image sensors, Finite-difference time-domain method, Silicon, Photodiodes, Metals

Proceedings Article | 3 March 2008 Paper
Proceedings Volume 6817, 681706 (2008) https://doi.org/10.1117/12.766045
KEYWORDS: Microlens, Cladding, Waveguides, Metals, Photodiodes, Finite-difference time-domain method, Geometrical optics, Dielectrics, Silicon, Optical filters

SPIE Journal Paper | 1 February 2008
JNP, Vol. 2, Issue 01, 021790, (February 2008) https://doi.org/10.1117/12.10.1117/1.2890424
KEYWORDS: Plasmonics, Wave propagation, Metals, Dielectrics, Surface plasmons, Interfaces, Dispersion, Coating, Solids, Waveguides

Proceedings Article | 3 February 2007 Paper
Proceedings Volume 6480, 64800C (2007) https://doi.org/10.1117/12.702917
KEYWORDS: Silicon carbide, Wave propagation, Polaritons, Coating, Thin films, Interfaces, Solids, Phonons, Finite-difference time-domain method, Radio propagation

Proceedings Article | 1 March 2006 Paper
Proceedings Volume 6128, 612818 (2006) https://doi.org/10.1117/12.648510
KEYWORDS: Metals, Dielectrics, Refractive index, Plasmonics, Dielectric polarization, Dispersion, Radio propagation, Waveguide modes, Metamaterials, Optical properties

Proceedings Article | 10 February 2006 Paper
Proceedings Volume 6069, 606904 (2006) https://doi.org/10.1117/12.650729
KEYWORDS: Quantum efficiency, Photons, Imaging systems, Sensors, Image sensors, Point spread functions, Image processing, Optical transfer functions, Optical filters, Image acquisition

Proceedings Article | 23 February 2005 Paper
Proceedings Volume 5678, (2005) https://doi.org/10.1117/12.588153
KEYWORDS: Point spread functions, Lens design, Image filtering, Distortion, Image processing, Imaging systems, Optical transfer functions, Fourier transforms, Image sensors, Systems modeling

Proceedings Article | 23 February 2005 Paper
Proceedings Volume 5678, (2005) https://doi.org/10.1117/12.592483
KEYWORDS: Sensors, Microlens, Image sensors, Imaging systems, Image quality, Signal to noise ratio, Photodetectors, Diffraction, Spatial resolution, Point spread functions

Proceedings Article | 28 May 2004 Paper
Michal Bordovsky, Peter Catrysse, Steven Dods, Marcio Freitas, Jackson Klein, Libor Kotacka, Velko Tzolov, Ivan Uzunov, Jiazong Zhang
Proceedings Volume 5355, (2004) https://doi.org/10.1117/12.526976
KEYWORDS: Waveguides, Finite-difference time-domain method, Beam propagation method, Optical amplifiers, Photonic integrated circuits, Ytterbium, Photonic crystals, Metals, Erbium, Glasses

Proceedings Article | 18 December 2003 Paper
Proceedings Volume 5294, (2003) https://doi.org/10.1117/12.537474
KEYWORDS: Sensors, Image sensors, Image quality, Image processing, Device simulation, RGB color model, Digital cameras, Imaging systems, Optical filters, Cadmium sulfide

Proceedings Article | 15 May 2001 Paper
Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426961
KEYWORDS: Modulation, Sensors, Light sources, Error analysis, Image sensors, Light emitting diodes, Imaging systems, Cameras, Color imaging, Blue light emitting diodes

Proceedings Article | 22 November 2000 Paper
Proceedings Volume 4124, (2000) https://doi.org/10.1117/12.407512
KEYWORDS: Wavefront sensors, Mirrors, Silicon, Imaging systems, Wavefronts, Deformable mirrors, Semiconducting wafers, Charge-coupled devices, Actuators, Adaptive optics

Proceedings Article | 15 May 2000 Paper
Ting Chen, Peter Catrysse, Abbas El Gamal, Brian Wandell
Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385463
KEYWORDS: Modulation transfer functions, Signal to noise ratio, Sensors, Spatial frequencies, Image sensors, Image processing, Image quality, Spatial resolution, Cameras, Device simulation

Proceedings Article | 15 May 2000 Paper
Peter Catrysse, Xinqiao Liu, Abbas El Gamal
Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385460
KEYWORDS: Quantum efficiency, Photodiodes, Vignetting, Sensors, Metals, CMOS sensors, CMOS technology, Double positive medium, Image sensors, Geometrical optics

Proceedings Article | 22 March 1999 Paper
Peter Catrysse, Brian Wandell, Abbas El Gamal
Proceedings Volume 3650, (1999) https://doi.org/10.1117/12.342860
KEYWORDS: Sensors, Signal to noise ratio, Image sensors, Optical filters, Color reproduction, Cameras, Error analysis, Digital cameras, Image quality, CMOS sensors

Showing 5 of 28 publications
Conference Committee Involvement (8)
Digital Photography and Mobile Imaging XI
9 February 2015 | San Francisco, California, United States
Digital Photography X
3 February 2014 | San Francisco, California, United States
Digital Photography IX
4 February 2013 | Burlingame, California, United States
Digital Photography VIII
23 January 2012 | Burlingame, California, United States
Digital Photography VII
24 January 2011 | San Francisco Airport, California, United States
Digital Photography VI
18 January 2010 | San Jose, California, United States
Digital Photography V
19 January 2009 | San Jose, California, United States
Digital Photography IV
28 January 2008 | San Jose, California, United States
Showing 5 of 8 Conference Committees
Course Instructor
SC762: Device Simulation for Image Quality Evaluation
Customers judge the image quality of a digital camera by viewing the final rendered output. Achieving a high quality output depends on the multiple system components, including the optical system, imaging sensor, image processor and display device. Consequently, analyzing components singly, without reference to the characteristics of the other components, provides only a limited view of the system performance. An integrated simulation environment, that models the entire imaging pipeline, is a useful tool that improves understanding and guides design. This course will introduce computational models to simulate the scene, optics, sensor, processor, display, and human observer. Example simulations of calibrated devices and imaging algorithms will be used to clarify how specific system components influence the perceived quality of the final output.
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