Dr. Ophir Almog
at Technion-Israel Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 September 2009 Paper
Ophir Almog, Maxim Shoshany
Proceedings Volume 7477, 74770H (2009) https://doi.org/10.1117/12.830291
KEYWORDS: Wavelets, Reflectivity, Vegetation, Reliability, Signal to noise ratio, Signal processing, Principal component analysis, Signal analyzers, Hyperspectral imaging, Image classification

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