Plasmonic and photonic nanoparticles have proven beneficial for solar cells in the aspect of light management. For improved exploitation of nanoparticles in solar cells, it is necessary to reveal the absorption enhancement mechanism from the nanoparticles. In this study, we investigated the nanoparticle-enhanced solar cells in near-field regime with optic and opto-electric scanning near-field optical microscopy (SNOM). The near-field distribution of regularly arranged silver and polystyrene nanoparticles produced by nanosphere lithography on Cu(In,Ga)Se2 (CIGSe) solar cells is characterized using a custom-built SNOM, which gives insight into the optical mechanism of light trapping from nanoparticles to solar cells. On the other hand, the photocurrent of CIGSe solar cells with and without nanoparticles is studied with an opto-electric SNOM by recording the photocurrent during surface scanning, further revealing the opto-electrical influences of the nanoparticles. In addition, finite element method simulations have been performed and agree with the results from SNOM. We found the dielectric polystyrene spheres are able to enhance the absorption and benefit the generation of charge carriers in the solar cells.
Martina Schmid, Guanchao Yin, Min Song, Shengkai Duan, Berit Heidmann, Diego Sancho-Martinez, Steven Kämmer, Tristan Köhler, Phillip Manley, Martha Lux-Steiner
Light concentration has proven beneficial for solar cells, most notably for highly efficient but expensive absorber materials using high concentrations and large scale optics. Here, we investigate the light concentration for cost-efficient thin-film solar cells that show nano- or microtextured absorbers. Our absorber material of choice is Cu(In,Ga)Se2 (CIGSe), which has a proven stabilized record efficiency of 22.6% and which—despite being a polycrystalline thin-film material—is very tolerant to environmental influences. Taking a nanoscale approach, we concentrate light in the CIGSe absorber layer by integrating photonic nanostructures made from dielectric materials. The dielectric nanostructures give rise to resonant modes and field localization in their vicinity. Thus, when inserted inside or adjacent to the absorber layer, absorption and efficiency enhancement are observed. In contrast to this internal absorption enhancement, external enhancement is exploited in the microscaled approach: mm-sized lenses can be used to concentrate light onto CIGSe solar cells with lateral dimensions reduced down to the micrometer range. These micro solar cells come with the benefit of improved heat dissipation compared with the large scale concentrators and promise compact high-efficiency devices. Both approaches of light concentration allow for reduction in material consumption by restricting the absorber dimension either vertically (ultrathin absorbers for dielectric nanostructures) or horizontally (microabsorbers for concentrating lenses) and have significant potential for efficiency enhancement.
Publisher’s Note: This paper, originally published on 23 September 2016, was replaced with a corrected/revised version on 21 December 2016. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance.
Light concentration has proven beneficial for solar cells, most notably for highly efficient but expensive absorber materials using high concentrations and large scale optics. Here we investigate light concentration for cost efficient thinfilm solar cells which show nano- or microtextured absorbers. Our absorber material of choice is Cu(In,Ga)Se2 (CIGSe) which has a proven stabilized record efficiency of 22.6% and which - despite being a polycrystalline thin-film material - is very tolerant to environmental influences. Taking a nanoscale approach, we concentrate light in the CIGSe absorber layer by integrating photonic nanostructures made from dielectric materials. The dielectric nanostructures give rise to resonant modes and field localization in their vicinity. Thus when inserted inside or adjacent to the absorber layer, absorption and efficiency enhancement are observed. In contrast to this internal absorption enhancement, external enhancement is exploited in the microscale approach: mm-sized lenses can be used to concentrate light onto CIGSe solar cells with lateral dimensions reduced down to the micrometer range. These micro solar cells come with the benefit of improved heat dissipation compared to the large scale concentrators and promise compact high efficiency devices. Both approaches of light concentration allow for reduction in material consumption by restricting the absorber dimension either vertically (ultra-thin absorbers for dielectric nanostructures) or horizontally (micro absorbers for concentrating lenses) and have significant potential for efficiency enhancement.
KEYWORDS: Particles, Near field scanning optical microscopy, Near field optics, Near field, Silver, Nanoparticles, Coating, Reflection, Glasses, Plasmonics
A scanning near-field optical microscope (SNOM) is a powerful tool to investigate optical effects that are smaller than Abbe’s limit. Its greatest strength is the simultaneous measurement of high-resolution topography and optical nearfield data that can be correlated to each other. However, the resolution of an aperture SNOM is always limited by the probe. It is a technical challenge to fabricate small illumination tips with a well-defined aperture and high transmission. The aperture size and the coating homogeneity will define the optical resolution and the optical image whereas the tip size and shape influence the topographic accuracy. Although the technique has been developing for many years, the correlation between simulated near-field data and measurement is still not convincing. To overcome this challenge, the mapping of near-field plasmonic interactions of silver nanoparticles is investigated. Different nanocluster samples with diverse distributions of silver particles are characterized via SNOM in illumination and collection mode. This will lead to topographical and optical images that can be used as an input for SNOM simulations with the aim of estimating optical artifacts. Including tip, particles, and substrate, our finite-elementmethod (FEM) simulations are based on the realistic geometry. Correlating the high-precision SNOM measurement and the detailed simulation of a full image scan will enable us to draw conclusions regarding near-field enhancements caused by interacting particles.
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