Maxim Drosdetsky
at National Research Nuclear Univ MEPhI
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 30 December 2016 Paper
Proceedings Volume 10224, 1022415 (2016) https://doi.org/10.1117/12.2267161
KEYWORDS: Field effect transistors, Oxides, Annealing, Interfaces, Instrument modeling, Capacitance, Diffusion, Transistors, Power supplies, Modeling and simulation

Proceedings Article | 18 December 2014 Paper
G. Zebrev, M. Drosdetsky, A. Galimov, A. Lebedev, I. Danilov, V. Turin
Proceedings Volume 9440, 94401C (2014) https://doi.org/10.1117/12.2180758
KEYWORDS: Oxides, Annealing, Integrated circuits, Analog electronics, Temperature metrology, Interfaces, Modeling and simulation, Thermal effects, Switching, Electrons

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