Mark G. Bigelow
Principal Owner
SPIE Involvement:
Author
Area of Expertise:
photography , metrology , imaging , lithography , optics , holography
Profile Summary

Sales and marketing executive with practical industrial experience in semiconductor manufacturing and advanced lithography systems. Strong drive to bring creative solutions and resources to customer requirements and applications while growing business opportunities.

Specialties: International experience in strategic marketing for large high technology capital equipment, experience in public relations, advertising for international markets
Publications (1)

Proceedings Article | 1 June 1990 Paper
Barton Katz, James Greeneich, Mark Bigelow, Ann Katz, Frits van Hout, Jos Coolsen
Proceedings Volume 1264, (1990) https://doi.org/10.1117/12.20183
KEYWORDS: Semiconducting wafers, Optical alignment, Photoresist processing, Reflectivity, Signal processing, Optical lithography, Overlay metrology, Wafer-level optics, Critical dimension metrology, Image processing

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