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Marc Finet
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Publications (1)
Proceedings Article | 13 February 2008 Paper
Femtosecond laser damage threshold and nonlinear characterization in bulk transparent SiC materials
G. Logan DesAutels, Chris Brewer, Mark Walker, Shane Juhl, Marc Finet, Scott Ristich, Matt Whitaker, Peter Powers
Proceedings Volume 6875, 68751M (2008) https://doi.org/10.1117/12.765560
KEYWORDS: Silicon carbide, Laser damage threshold, Femtosecond phenomena, Absorption, Refraction, Optical microscopes, Atomic force microscopy, Laser processing, Silicon, Image processing
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