Dr. Luis Granero-Montagud
Senior Researcher at Univ de València
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 28 July 2017 Paper
Proceedings Volume 10413, 104130D (2017) https://doi.org/10.1117/12.2286040

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10329, 1032948 (2017) https://doi.org/10.1117/12.2270302
KEYWORDS: Tolerancing, Inspection, Manufacturing, Optics manufacturing, Assembly tolerances, 3D image processing, Defect detection, Process control, Aerospace engineering, Aluminum, Reflector telescopes, Image processing, Carbon, Prototyping, Clouds, Head

Proceedings Article | 29 April 2016 Paper
Proceedings Volume 9896, 98960E (2016) https://doi.org/10.1117/12.2225590
KEYWORDS: Digital holography, Microscopy, Interferometry, Super resolution, Holography, Multiplexing, Imaging systems, Image acquisition, Digital recording, Sensors, Diffraction, Charge-coupled devices, Image resolution, Holograms, RGB color model

Proceedings Article | 22 June 2015 Paper
Proceedings Volume 9525, 95253X (2015) https://doi.org/10.1117/12.2184790
KEYWORDS: Image registration, Fourier transforms, Computing systems, Image resolution, Computer programming, Medical imaging, Optical metrology, Graphics processing units, Pixel resolution, Sensors

Proceedings Article | 22 June 2015 Paper
Proceedings Volume 9525, 95253U (2015) https://doi.org/10.1117/12.2184779
KEYWORDS: Charge-coupled devices, Holography, Spatial light modulators, Phase shifts, Digital holography, 3D image reconstruction, Wavefronts, Diffraction, Image resolution, Image quality

Proceedings Article | 30 May 2013 Paper
Luís Granero-Montagud, Cristina Portalés, Begoña Pastor-Carbonell, Emilio Ribes-Gómez, Antonio Gutiérrez-Lucas, Vivi Tornari, Vassilis Papadakis, Roger Groves, Beril Sirmacek, Alessandra Bonazza, Izabela Ozga, Jan Vermeiren, Koen van der Zanden, Matthias Föster, Petra Aswendt, Albert Borreman, Jon Ward, António Cardoso, Luís Aguiar, Filipa Alves, Polonca Ropret, José María Luzón-Nogué, Christian Dietz
Proceedings Volume 8790, 879008 (2013) https://doi.org/10.1117/12.2020336
KEYWORDS: 3D modeling, Clouds, Cameras, Chemical analysis, 3D image processing, 3D image reconstruction, 3D acquisition, Fringe analysis, Calibration, Statistical analysis

Proceedings Article | 30 May 2013 Paper
Luís Granero-Montagud, Cristina Portalés, Begoña Pastor-Carbonell, Emilio Ribes-Gómez, Antonio Gutiérrez-Lucas, Vivi Tornari, Vassilis Papadakis, Roger Groves, Beril Sirmacek, Alessandra Bonazza, Izabela Ozga, Jan Vermeiren, Koen van der Zanden, Matthias Föster, Petra Aswendt, Albert Borreman, Jon Ward, António Cardoso, Luís Aguiar, Filipa Alves, Polonca Ropret, José María Luzón-Nogué, Christian Dietz
Proceedings Volume 8790, 879011 (2013) https://doi.org/10.1117/12.2020333
KEYWORDS: Prototyping, 3D image processing, Chemical analysis, Data acquisition, Hyperspectral imaging, Raman spectroscopy, Short wave infrared radiation, Databases, Infrared imaging, Infrared radiation

Proceedings Article | 13 May 2013 Paper
Proceedings Volume 8788, 878808 (2013) https://doi.org/10.1117/12.2020580
KEYWORDS: Microscopy, Holography, Digital holography, Charge-coupled devices, Multiplexing, Holograms, Interferometry, RGB color model, Super resolution, Image resolution

Proceedings Article | 27 May 2011 Paper
Proceedings Volume 8082, 80820A (2011) https://doi.org/10.1117/12.889339
KEYWORDS: Charge-coupled devices, Digital holography, Imaging systems, Holography, Image resolution, Holograms, Prisms, Multiplexing, Fourier transforms, Super resolution

Proceedings Article | 7 July 2009 Paper
L. Granero, F. Diaz, R. Dominguez, J. Hervás, S. Simón, E. Pérez
Proceedings Volume 7391, 73910B (2009) https://doi.org/10.1117/12.827536
KEYWORDS: 3D acquisition, 3D modeling, Projection systems, Scanners, Chemical elements, Systems modeling, Cameras, 3D metrology, Computing systems, Chemical analysis

Proceedings Article | 18 June 2007 Paper
L. Granero, J. Sánchez, V. Micó, J. J. Esteve, J. Hervás, S. Simón, E. Pérez
Proceedings Volume 6616, 66164B (2007) https://doi.org/10.1117/12.726641
KEYWORDS: Computer aided design, Finite element methods, Solid modeling, 3D acquisition, 3D modeling, 3D metrology, Reverse modeling, Chemical elements, Systems modeling, Manufacturing

Showing 5 of 11 publications
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