Dr. Lance Glasser
Retired
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67302V (2007) https://doi.org/10.1117/12.747255
KEYWORDS: Electron beam direct write lithography, Reticles, Semiconducting wafers, Lithography, Prototyping, Photomasks, Manufacturing, Very large scale integration, Logic, Electron beam lithography

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