Mr. Kerry J. Nagel Profile

Kerry J. Nagel

at Everspin Technologies Inc

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 4 October 2022 Presentation

Spin-transfer torque MRAM technology development: tuning MTJ characteristics to build high density stand-alone to low-latency industrial products (Conference Presentation)

Fred Mancoff, Monika Arora, Mark DeHerrera, Sumio Ikegawa, Han Lee, Subir Mukherjee, Goei Shimon, Jijun Sun, Iftekhar Rahman, Frederick Neumeyer, Hsuan-Yi Chou, Chin Hoe Tan, Amit Shah, Syed Alam, Kerry Nagel, Sanjeev Aggarwal

Proceedings Volume PC12205, PC122050C (2022) https://doi.org/10.1117/12.2635022

KEYWORDS: Data centers, Switching, CMOS technology, Aerospace engineering, Temperature metrology, Manufacturing, Magnetism

Read Abstract +

Proceedings Article | 3 September 1999 Paper

IC yield enhancement through optimization of photolithography pattern at the isolation step

Kerry Nagel, Steve Spivey, Ping Wang

Proceedings Volume 3882, (1999) https://doi.org/10.1117/12.361322

KEYWORDS: Photoresist developing, Photoresist materials, Optical lithography, Yield improvement, Chemistry, Oxides, Etching, Silicon, Critical dimension metrology, Photomasks

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years