Kenji Hosoi
at Central Glass Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 18 April 2017 Presentation + Paper
William Earley, Deanna Soucie, Kenji Hosoi, Arata Takahashi, Takashi Aoki, Brian Cardineau, Koichi Miyauchi, Jay Chun, Michael O'Sullivan, Robert Brainard
Proceedings Volume 10146, 101460H (2017) https://doi.org/10.1117/12.2258324
KEYWORDS: Photoresist materials, Extreme ultraviolet, Lithography, Extreme ultraviolet lithography, Polymers, Line width roughness, Solids, Polymerization, Sodium, Glasses

Proceedings Article | 20 March 2012 Paper
Kenji Hosoi, Brian Cardineau, William Earley, Seth Kruger, Koichi Miyauchi, Robert Brainard
Proceedings Volume 8325, 83251S (2012) https://doi.org/10.1117/12.917018
KEYWORDS: Polymers, Amplifiers, Line edge roughness, Extreme ultraviolet lithography, Extreme ultraviolet, Lithography, Diffusion, Glasses, Molecules, Neck

Proceedings Article | 20 March 2012 Paper
Proceedings Volume 8325, 832514 (2012) https://doi.org/10.1117/12.917015
KEYWORDS: Amplifiers, Fluorine, Line edge roughness, Extreme ultraviolet lithography, Lithography, Polymers, Photoresist materials, Polymerization, Temperature metrology, Extreme ultraviolet

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top