Kathleen Brockdorf
at GE Sensing & Inspection Technologies Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 September 2008 Paper
Proceedings Volume 7078, 70780U (2008) https://doi.org/10.1117/12.794789
KEYWORDS: Absorption, X-rays, Spatial resolution, X-ray computed tomography, Bone, Computed tomography, Synchrotrons, Synchrotron radiation, Copper, Sensors

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