The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in
fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close
proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electro-optic
field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic
sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of
emerging materials, such as diluted magnetic semiconductors, is also considered.
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