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John D. Gilmore
Image Sensor Manager at Hamamatsu Corp
SPIE Involvement:
Author | Special Event Speaker
Publications (1)
Proceedings Article | 10 June 2024 Presentation
FT-NIR spectroscopy for process automation technology (PAT)
John Gilmore, Slawomir Piatek, Stephanie Butron
Proceedings Volume 13026, 1302608 (2024) https://doi.org/10.1117/12.3014124
KEYWORDS: Automation, FT-NIR spectroscopy, Statistical analysis, Spectrometers, Solids, Solid state electronics, Quality control, Portability, Physics, Near infrared spectroscopy
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