Dr. Joachim Barenz Profile

Dr. Joachim Barenz

Head of Chief Engineers Office at Diehl Defence GmbH & Co KG

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 22 April 2010 Paper

Fast and precise point spread function measurements of IR optics at extreme temperatures based on reversed imaging conditions

Volker Melzer, Hans-Georg Heckmann, Christian Ritter, Joachim Barenz, Michael Raab

Proceedings Volume 7662, 766213 (2010) https://doi.org/10.1117/12.850194

KEYWORDS: Modulation transfer functions, Point spread functions, Staring arrays, Sensors, Temperature metrology, Climatology, Imaging systems, Mid-IR, Optical testing, Collimators

Read Abstract +

Proceedings Article | 6 October 2007 Paper

Hadamard camera for 3D imaging

Eugen Romasew, Joachim Barenz, Hans Dieter Tholl

Proceedings Volume 6737, 67370A (2007) https://doi.org/10.1117/12.737337

KEYWORDS: Chemical elements, 3D image processing, Sensors, Stereoscopic cameras, Digital micromirror devices, 3D metrology, Cameras, Micromirrors, 3D acquisition, Imaging systems

Read Abstract +

Proceedings Article | 19 May 2005 Paper

Eyesafe imaging LADAR/infrared seeker technologies

J. Barenz, R. Baumann, H. Tholl

Proceedings Volume 5791, (2005) https://doi.org/10.1117/12.603329

KEYWORDS: Sensors, LIDAR, Infrared sensors, Infrared radiation, Infrared imaging, Missiles, Optical sensors, Optical amplifiers, Beam splitters, Image sensors

Read Abstract +

Proceedings Article | 1 September 2004 Paper

All solid state imaging infrared/imaging LADAR sensor system

Joachim Barenz, Rainer Baumann, Frank Imkenberg, Dirk Krogmann, Hans-Dieter Tholl

Proceedings Volume 5459, (2004) https://doi.org/10.1117/12.545360

KEYWORDS: Sensors, LIDAR, Infrared sensors, Infrared radiation, Infrared imaging, Imaging systems, Optical sensors, Prisms, Image sensors, Fiber amplifiers

Read Abstract +

Proceedings Article | 24 September 1997 Paper

Micromachined aperture probe tip for multifunctional scanning probe microscopy

Michael Abraham, Wolfgang Ehrfeld, Manfred Lacher, Othmar Marti, Karsten Mayr, Wilfried Noell, Peter Guethner, Joachim Barenz

Proceedings Volume 3099, (1997) https://doi.org/10.1117/12.281234

KEYWORDS: Waveguides, Near field scanning optical microscopy, Near field optics, Sensors, Atomic force microscopy, Microfabrication, Scanning probe microscopy, Prisms, Silicon, Micromachining

Read Abstract +

Proceedings Article | 15 April 1997 Paper

Micromachined aperture probe tip for multifunctional scanning probe microscopy

Michael Abraham, Wolfgang Ehrfeld, Manfred Lacher, Karsten Mayr, Wilfried Noell, Peter Guethner, Joachim Barenz

Proceedings Volume 3009, (1997) https://doi.org/10.1117/12.271226

KEYWORDS: Waveguides, Near field scanning optical microscopy, Near field optics, Sensors, Microfabrication, Scanning probe microscopy, Atomic force microscopy, Aluminum, Prisms, Near field

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years