Mr. Jia-Syun Cai Profile

Jia-Syun Cai

at National Taiwan Univ

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 10 April 2024 Presentation + Paper

A transistor sizing method for standard-cell optimization considering lithography effects

Jia-Syun Cai, Pin-Yuan Su, Chien-Lin Lee, Kuen-Yu Tsai

Proceedings Volume 12954, 129540C (2024) https://doi.org/10.1117/12.3012028

KEYWORDS: Transistors, Lithography, Optical proximity correction, Semiconducting wafers, Device simulation, Design rules, Field effect transistors, Extreme ultraviolet lithography

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Proceedings Article | 30 April 2023 Presentation

An improved transistor sizing method for standard-cell optimization

Pin-Yuan Su, Jia-Syun Cai, Chien-Lin Lee, Kuen-Yu Tsai

Proceedings Volume 12495, 1249512 (2023) https://doi.org/10.1117/12.2658706

KEYWORDS: Transistors, Standards development

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SPIE Journal Paper | 10 July 2021

Efficient electrical characteristics estimation techniques for sub-20-nm FDSOI integrated circuits with nonrectangular gate patterning effects

Jia-Syun Cai, Sheng-Wei Chien, Xin-Yang Zheng, Chien-Lin Lee, Kuen-Yu Tsai

JM3, Vol. 20, Issue 03, 033401, (July 2021) https://doi.org/10.1117/12.10.1117/1.JMM.20.3.033401

KEYWORDS: TCAD, Transistors, Device simulation, 3D modeling, Integrated circuits, Instrument modeling, Lithography, Error analysis, Logic, Doping

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SPIE Journal Paper | 27 April 2021

Precision fabrication of EUVL programmed defects with helium ion beam patterning

Chien-Lin Lee, Jia-Syun Cai, Sheng-Wei Chien, Kuen-Yu Tsai, Jia-Han Li, Chao-Te Lee

JM3, Vol. 20, Issue 02, 023001, (April 2021) https://doi.org/10.1117/12.10.1117/1.JMM.20.2.023001

KEYWORDS: Optical lithography, Palladium, Helium, Ion beams, Direct write lithography, Metrology, Extreme ultraviolet lithography, Lithography, Silicon, Glasses

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