Dr. Jennifer Morrell-Falvey
Senior Research Associate at Oak Ridge National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2015 Paper
Sneha Polisetti, Nameera Baig, Amber Bible, Jennifer Morrell-Falvey, Mitchel Doktycz, Paul Bohn
Proceedings Volume 9550, 95500D (2015) https://doi.org/10.1117/12.2188647
KEYWORDS: Raman spectroscopy, Surface enhanced Raman spectroscopy, Bacteria, Ultraviolet radiation, Nondestructive evaluation, Silver, Chemical analysis, Imaging spectroscopy, Silicon, Semiconducting wafers

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