James Condie
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2020 Presentation + Paper
Proceedings Volume 11493, 1149310 (2020) https://doi.org/10.1117/12.2568833
KEYWORDS: Scattering, X-rays, Statistical modeling, Laser scattering, Light sources, X-ray imaging, Scanning electron microscopy, Optical simulations, Light scattering, X-ray optics

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