Ian J. Duckling
Senior Engineer at Thales Missile Electronics Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 August 2002 Paper
Ian Duckling, Michael Chappell, John Cunningham
Proceedings Volume 4742, (2002) https://doi.org/10.1117/12.479152
KEYWORDS: Metals, Sensors, Aluminum, Data modeling, Land mines, Mining, Electromagnetism, Inductance, Electromagnetic coupling, Neural networks

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