Dr. Hong Chen Profile

Dr. Hong Chen

at Arizona State Univ

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 15 March 2023 Presentation + Paper

Degradation of GaN-based InGaN-GaN MQWs solar cells caused by thermally-activated diffusion

Marco Nicoletto, Alessandro Caria, Carlo De Santi, Matteo Buffolo, Xuanqui Huang, Houqiang Fu, Hong Chen, Yuji Zhao, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 12421, 1242106 (2023) https://doi.org/10.1117/12.2653110

KEYWORDS: Diffusion, Solar cells, Quantum processes, Hydrogen, Gallium nitride, Quantum wells, Magnesium, Electroluminescence, Quantum experiments, Quantum devices

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Proceedings Article | 15 March 2023 Presentation + Paper

Experimental analysis of degradation of multi-quantum well GaN based solar cells under current stress

Alessandro Caria, Carlo De Santi, Marco Nicoletto, Matteo Buffolo, Xuanqi Huang, Houqiang Fu, Hong Chen, Yuji Zhao, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 12421, 124210D (2023) https://doi.org/10.1117/12.2653129

KEYWORDS: Solar cells, Quantum experiments, Photovoltaics, External quantum efficiency, Gallium nitride, Quantum wells, Solar energy

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Proceedings Article | 5 March 2022 Presentation + Paper

GaN-based solar cells degradation kinetics investigated at high temperature under high-intensity 405nm optical stress

Alessandro Caria, Carlo De Santi, Marco Nicoletto, Matteo Buffolo, Xuanqi Huang, Houqiang Fu, Hong Chen, Yuji Zhao, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 12001, 1200107 (2022) https://doi.org/10.1117/12.2608680

KEYWORDS: Solar cells, Luminescence, External quantum efficiency, Quantum wells, Solar energy, Quantum efficiency, Reliability

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Proceedings Article | 16 February 2020 Paper

Degradation and recovery of high-periodicity InGaN/GaN MQWs under optical stress in short-circuit condition

Alessandro Caria, Carlo De Santi, Filippo Zamperetti, Xuanqi Huang, Houqiang Fu, Hong Chen, Yuji Zhao, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 11280, 112800E (2020) https://doi.org/10.1117/12.2547590

KEYWORDS: External quantum efficiency, Quantum efficiency, Solar cells, Quantum wells, Reliability, Wafer-level optics, Resistance, Gallium nitride, Silicon

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