Hiromu Kijima
at Canon Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 August 2024 Paper
Proceedings Volume 13177, 1317709 (2024) https://doi.org/10.1117/12.3032446
KEYWORDS: Nanoimprint lithography, Artificial intelligence, Lithography, Overlay metrology, Metrology, Optical lithography, Data modeling, Manufacturing, Computer simulations, Semiconducting wafers

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 129540Z (2024) https://doi.org/10.1117/12.3009839
KEYWORDS: Nanoimprint lithography, Artificial intelligence, Lithography, Metrology, Computer simulations

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top