Fengling Zhang
at ARCNL
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 June 2024 Presentation
Antonios Pelekanidis, Fengling Zhang, Matthias Gouder, Kjeld S. Eikema, Stefan Witte
Proceedings Volume PC13023, PC1302308 (2024) https://doi.org/10.1117/12.3022842
KEYWORDS: Extreme ultraviolet, Light sources and illumination, High harmonic generation, Multiplexing, Image resolution, Diffraction, Binary data, Wavefronts, Physical coherence, Microscopes

Proceedings Article | 8 June 2023 Presentation
Stefan Witte, Menqgi Du, Fengling Zhang, Antonios Pelekanidis, Matthias Gouder, Xiaomeng Liu, Kjeld Eikema
Proceedings Volume PC12582, PC1258203 (2023) https://doi.org/10.1117/12.2665071
KEYWORDS: Extreme ultraviolet, Wavefront sensors, Coherence imaging, Optical coherence, Imaging systems, Image resolution, Wavefronts, Wavefront aberrations, Range imaging, Nanotechnology

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