Mr. Eric J Meisenzahl Profile

Eric J Meisenzahl

Director, ISG R&D at ON Semiconductor

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Author

Publications (9)

Proceedings Article | 15 February 2012 Paper

29-mp 35-mm format interline CCD image sensor

Eric Meisenzahl, Douglas Carpenter, James DiBella, James Doran, Robert Fabinski, Stephen Kosman, John McCarten

Proceedings Volume 8298, 82980L (2012) https://doi.org/10.1117/12.909635

KEYWORDS: Photodiodes, CCD image sensors, Ferroelectric LCDs, Charge-coupled devices, Quantum efficiency, Image resolution, Cameras, Sensors, Silicon, Microlens

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Proceedings Article | 28 January 2009 Paper

New 5.5 µm interline transfer CCD platform for applied imaging markets

Douglas Carpenter, James DiBella, Robert Kaser, Stephen Kosman, Xueyuan Liu, John McCarten, Eric Meisenzahl, David Nichols, Christopher Parks, Thomas Pian

Proceedings Volume 7249, 72490C (2009) https://doi.org/10.1117/12.806389

KEYWORDS: Charge-coupled devices, CCD image sensors, Image sensors, Quantum efficiency, Sensors, Cameras, Electrons, Photodiodes, Imaging systems, Product engineering

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Proceedings Article | 10 February 2006 Paper

31 Mp and 39 Mp full-frame CCD image sensors with improved charge capacity and angle response

Eric Meisenzahl, Edmund Banghart, David Nichols, John Shepherd, Eric Stevens, Kwok Wong

Proceedings Volume 6069, 606902 (2006) https://doi.org/10.1117/12.651672

KEYWORDS: Microlens, Quantum efficiency, Image sensors, Charge-coupled devices, Oxides, CCD image sensors, Sensors, Optical filters, Cameras, Metals

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Proceedings Article | 23 February 2005 Paper

An LOD with improved breakdown voltage in full-frame CCD devices

Edmund Banghart, Eric Stevens, Hung Doan, John Shepherd, Eric Meisenzahl

Proceedings Volume 5678, (2005) https://doi.org/10.1117/12.594402

KEYWORDS: Electrodes, Charge-coupled devices, Imaging systems, Doping, Dielectrics, Silicon, Data modeling, Numerical simulations, Arsenic, Oxidation

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Proceedings Article | 24 April 2002 Paper

Front-illuminated full-frame charge-coupled-device image sensor achieves 85% peak quantum efficiency

Antonio Ciccarelli, William Davis, William Des Jardin, Hung Doan, Eric Meisenzahl, Laurel Pace, Gloria Putnam, Joseph Shepherd, Eric Stevens, Joseph Summa, Keith Wetzel

Proceedings Volume 4669, (2002) https://doi.org/10.1117/12.463447

KEYWORDS: Charge-coupled devices, Quantum efficiency, Microlens, Sensors, Electrodes, Image sensors, CCD image sensors, Cameras, Near infrared, Imaging systems

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Proceedings Article | 15 May 2000 Paper

3.2-million-pixel full-frame true 2-phase CCD image sensor incorporating transparent gate technology

Eric Meisenzahl, Winchyi Chang, William Des Jardin, Hung Doan, Joseph Shepherd, Eric Stevens

Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385464

KEYWORDS: Sensors, Charge-coupled devices, Quantum efficiency, Photons, CCD image sensors, Image sensors, Electrodes, Silicon, Electrons, Signal processing

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Proceedings Article | 25 November 1999 Paper

Six-million-pixel full-frame true 2-f CCD image sensor incorporating transparent gate technology and optional antiblooming protection

Eric Meisenzahl, Winchyi Chang, William Des Jardin, Stephen Kosman, Joseph Shepherd, Eric Stevens, Kwok Wong

Proceedings Volume 3764, (1999) https://doi.org/10.1117/12.371090

KEYWORDS: Sensors, Quantum efficiency, Charge-coupled devices, Photons, CCD image sensors, Electrons, Image sensors, Electrodes, Silicon, Measurement devices

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Proceedings Article | 10 April 1995 Paper

Modular high-performance 2-um CCD-BiCMOS process technology for application-specific image sensors and image sensor systems on a chip

R. Michael Guidash, P. Lee, J. Andrus, Antonio Ciccarelli, H. Erhardt, J. Fischer, Eric Meisenzahl, Robert Philbrick, Timothy Kenney

Proceedings Volume 2415, (1995) https://doi.org/10.1117/12.206521

KEYWORDS: Charge-coupled devices, Image processing, CCD image sensors, Sensors, Image sensors, Cadmium sulfide, Clocks, CMOS devices, CCD cameras, Digital image processing

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Proceedings Article | 1 July 1991 Paper

1536 x 1024 CCD image sensor

Kwok Wong, Georgia Torok, Winchyi Chang, Eric Meisenzahl

Proceedings Volume 1447, (1991) https://doi.org/10.1117/12.45332

KEYWORDS: Sensors, Charge-coupled devices, CCD image sensors, Image sensors, Electrodes, Electrons, Microelectronics, Image resolution, Optical resolution, Solid state electronics

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Showing 5 of 9 publications

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