This paper introduces a steganographic algorithm that generates a stego image based on a model describing plausible values for the pixels of that image. The model is established by analyzing a number of realizations of the cover image. The main contribution of the approach is that the model describes dependencies on adjacent pixels. Consequently, embedding according to the suggested approach considers image structures. The general approach includes parameters that influence the achievable security of embedding. Extensive practical tests using selected steganalytical methods illustrate the improvements of security compared to additive steganography and point out reasonable settings for the parameters.
Within this article, we investigate possibilities for identifying the origin of images acquired with flatbed scanners. A current method for the identification of digital cameras takes advantage of image sensor noise, strictly speaking, the spatial noise. Since flatbed scanners and digital cameras use similar technologies, the utilization of image sensor noise for identifying the origin of scanned images seems to be possible.
As characterization of flatbed scanner noise, we considered array reference patterns and sensor line reference patterns. However, there are particularities of flatbed scanners which we expect to influence the identification. This was confirmed by extensive tests: Identification was possible to a certain degree, but less reliable than digital camera identification. In additional tests, we simulated the influence of flatfielding and down scaling as examples for such particularities of flatbed scanners on digital camera identification. One can conclude from the results achieved so far that identifying flatbed scanners is possible. However, since the analyzed methods are not able to determine the image origin in all cases, further investigations are necessary.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.