David B. Gariepy
President and Sales Representative at Saratoga Data Systems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2005 Paper
Proceedings Volume 5992, 599213 (2005) https://doi.org/10.1117/12.631780
KEYWORDS: Optical proximity correction, Chemical mechanical planarization, Resolution enhancement technologies, Optimization (mathematics), Manufacturing, Photomask technology, Ranging, System on a chip, Analog electronics

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