Dr. Daniel J. Cavicchio
at Block Engineering LLC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 February 2008 Paper
D. Reyes, E. Schildkraut, J. Kim, R. Connors, P. Kotidis, D. Cavicchio
Proceedings Volume 6888, 68880D (2008) https://doi.org/10.1117/12.764006
KEYWORDS: Microelectromechanical systems, FT-IR spectroscopy, Michelson interferometers, Spectrometers, Mirrors, Interferometers, Modulation, Optics manufacturing, Scanning electron microscopy, Photomicroscopy

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