Dan W. Thomas
at Oakland Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 December 2008 Paper
Proceedings Volume 7130, 71302W (2008) https://doi.org/10.1117/12.819663
KEYWORDS: Speckle pattern, Interferometry, Phase measurement, 3D metrology, Phase shifts, Interferometers, Cameras, Speckle, Switches, Sensors

Proceedings Article | 19 August 2005 Paper
Proceedings Volume 5878, 58780C (2005) https://doi.org/10.1117/12.617592
KEYWORDS: Microelectromechanical systems, Bragg cells, Mirrors, Vibrometry, Speckle, Fringe analysis, Control systems, CCD cameras, Diffraction, Reflectivity

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