Dr. Duc Toan Tran
Researcher at Univ Libre de Bruxelles
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 February 2015 Paper
Duc Toan Tran, Bart Jansen, Rudi Deklerck, Olivier Debeir
Proceedings Volume 9445, 94450Y (2015) https://doi.org/10.1117/12.2181017
KEYWORDS: Image classification, Databases, Distance measurement, Quantization, Image analysis, Object recognition, Visualization, Image compression, Principal component analysis, Machine vision

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