Chuo-Han Lee
at National Yang Ming Chiao Tung Univ.
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 28 June 2013 Paper
Erwin Deng, Rachel Lee, Chun Der Lee
Proceedings Volume 8701, 87010L (2013) https://doi.org/10.1117/12.2028297
KEYWORDS: Photomasks, Statistical modeling, Electronic design automation, Control systems, Data modeling, Failure analysis, Microelectronics, Inspection, Semiconducting wafers

Proceedings Article | 28 June 2013 Paper
Erwin Deng, Chun Der Lee, Rachel Lee
Proceedings Volume 8701, 87010K (2013) https://doi.org/10.1117/12.2028296
KEYWORDS: Photomasks, Quality systems, Control systems, Semiconducting wafers, Document management, Manufacturing, Electronic design automation, Error analysis, Microelectronics, Semiconductor manufacturing

Proceedings Article | 30 June 2012 Paper
Erwin Deng, Rachel Lee, Chun Der Lee
Proceedings Volume 8441, 84410T (2012) https://doi.org/10.1117/12.964097
KEYWORDS: Photomasks, Electronic design automation, Semiconducting wafers, Computer aided design, Inspection, Data processing, Error analysis, Semiconductors, Manufacturing, Databases

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