KEYWORDS: Charge-coupled devices, Error analysis, Signal processing, Data processing, CCD image sensors, Applied research, Signal detection, Digital signal processing, Computing systems, Semiconductor lasers
The method of average threshold and the Maximum Classification Square Error Method are the important statistics
methods in the data signal process. The result of calculation are compared. The constitution of the linear CCD measuring
system are induced. The compare experiment using the instrument whose precision less than 0.1 are detected. On the
condition of outside light interfere, the result of experiment is satisfied to the expectation of the measuring.
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