Christopher Eng
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 September 2013 Paper
Proceedings Volume 8851, 88510D (2013) https://doi.org/10.1117/12.2025842
KEYWORDS: Tomography, X-ray microscopy, Particles, Copper, X-ray imaging, Nickel, Aluminum, Image resolution, Nondestructive evaluation, Temperature metrology

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