Based on semiconductor process conditions such as power, gas, temperature and pressure, proper elastomer seal material selection is vital to maximizing the performance and productivity of wafer process production systems. Numerous metrology and test methods are used to measure the combined performance of elastomer seals. It is extremely important to take into consideration several performance parameters because minute shifts or modifications to process conditions can have detrimental effects on the production process. Weight loss, FTIR, SEM, Laser Confocal Microscope, and ICP/MS are some of the test methods used by Greene, Tweed to predict, with high confidence, the performance of elastomer seals for specific process conditions. This methodology is used to support the semiconductor research and process development community.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.