Prof. Chan Hyuk Kim
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2020 Presentation
Proceedings Volume 11249, 112490Y (2020) https://doi.org/10.1117/12.2551132
KEYWORDS: Diffraction, Optical tomography, Tomography, Optical tracking, Microscopy, 3D image processing, Stereoscopy, Image resolution, Electron microscopy, Super resolution microscopy

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