Dr. Atthaphon Ariyarit
at Suranaree Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 May 2022 Paper
Wannida Sae-Tang, Atthaphon Ariyarit
Proceedings Volume 12177, 121770O (2022) https://doi.org/10.1117/12.2626141
KEYWORDS: Defect detection, RGB color model, Model-based design, Image classification, Image processing, Convolutional neural networks, Wavelet transforms, Statistical modeling, Spectral models, Neural networks

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