Antoine Verhaeghe
at Ctr Suisse d'Electronique et de Microtechnique SA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 July 2018 Presentation + Paper
Proceedings Volume 10706, 1070616 (2018) https://doi.org/10.1117/12.2311976
KEYWORDS: Finite element methods, Inspection, Manufacturing, Sensors, Actuators, Failure analysis, Mars, Commercial off the shelf technology

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