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Dr. Aksel Goehnermeier
at Carl Zeiss Industrielle Messtechnik GmbH
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Author
Publications (3)
Proceedings Article | 18 October 2024 Presentation + Paper
Self-supervised deep image restoration for x-ray computed laminographic tomography
Proceedings Volume 13152, 131520T (2024) https://doi.org/10.1117/12.3028278
KEYWORDS: Image restoration, Computed tomography, X-ray imaging, Inspection, X-ray computed tomography, Denoising, CT reconstruction
Proceedings Article | 23 August 2023 Presentation
On aberration retrieval for optical microscopes in length metrology
Jan Krüger, Bernd Bodermann, Rainer Köning, Phillip Manley, Lin Zschiedrich, Philipp-Immanuel Schneider, Andreas Heinrich, Christian Eder, Ulrike Zeiser, Aksel Goehnermeier
Proceedings Volume PC12619, PC126190A (2023) https://doi.org/10.1117/12.2672294
KEYWORDS: Optical aberrations, Imaging systems, Optical microscopes, Metrology, Point spread functions, Simulations, Reflection, Quality systems, Polarization, Objectives
Proceedings Article | 23 August 2023 Presentation
Efficient simulation of microscopic imaging for reconstruction of nanostructures
Phillip Manley, Jan Krüger, Bernd Bodermann, Rainer Köning, Andreas Heinrich, Christian Eder, Aksel Goehnermeier, Ulrike Zeiser, Martin Hammerschmidt, Lin Zschiedrich, Philipp-Immanuel Schneider
Proceedings Volume PC12619, PC126190B (2023) https://doi.org/10.1117/12.2673077
KEYWORDS: Nanostructures, Electron microscopy, Scattering, Diffraction limit, Diffraction, Optical microscopy, Near field optics, Near field, Multilayers, Modeling
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