CONFERENCE PROCEEDINGS
Advanced Search
Adam T. Baker
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 13 March 2024 Poster
Modeling the mechanical focal plane of atomic force microscopy
Adam Baker, Bruce Gao, Reece Fratus, Delphine Dean, Tong Ye, Farhad Shokati
Proceedings Volume PC12844, PC128440X (2024) https://doi.org/10.1117/12.3003157
KEYWORDS: Atomic force microscopy, Modeling, Polystyrene, Mechanics, Equipment, Composites, Beam analyzers, Analog electronics, 3D modeling, 3D metrology
Proceedings Article | 15 March 2023 Paper
Coregistration of multiphoton fluorescence with nanoscopic resolution atomic force microscopy
Adam Baker, Zhi Gao, Thomas Borg, Qi Wang, Tong Ye, Arman Kilic, Reece Fratus, Lucas Schmidt
Proceedings Volume 12430, 1243011 (2023) https://doi.org/10.1117/12.2650709
KEYWORDS: Atomic force microscopy, Tissues, Polydimethylsiloxane, Natural surfaces, Myocardium, Biological samples, Image registration, Second harmonic generation, Heart, Multiphoton fluorescence microscopy
Proceedings Article | 8 March 2023 Poster + Paper
Evaluating vessel mechanics with optical coherence tomography based digital image correlation
Reece Fratus, Thomas Fair, Adam Baker, Lucas Schmidt, Tong Ye, Qi Wang, Taixing Cui, Thomas Borg, Arman Kilic, Bruce Gao
Proceedings Volume 12367, 1236712 (2023) https://doi.org/10.1117/12.2650491
KEYWORDS: Optical coherence tomography, Digital image correlation, Tissues, Arteries, Veins, Mechanics, Imaging systems, Image resolution, Speckle pattern
Proceedings Article | 2 March 2022 Presentation + Paper
Integrating SHG and two-color STED microscopy for super-resolved imaging of cell-matrix interactions in myocardium
Zhao Zhang, Adam Baker, Hongming Fan, William Richardson, Thomas Borg, Bruce Gao, Tong Ye
Proceedings Volume 11967, 1196708 (2022) https://doi.org/10.1117/12.2610374
KEYWORDS: Stimulated emission depletion microscopy, Second-harmonic generation, Microscopy, Confocal microscopy, Collagen, Microscopes, Nanoparticles, Visualization, Proteins
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top