We report on the development and implementation of a diagnostic for the temporal characterization of seeded XUV laser pulses, based on laser-dressed photoionization in the sideband regime, using a home-made velocity map-imaging spectrometer as the central element. The diagnostic was recently tested at the LASERIX facility with the seeded Ne-like titanium laser at 38 eV as the XUV source, overlapped with an infrared pulse of variable duration and intensity.
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