On the problems of stability and durability of field-emission current sources for electrovacuum devices

Alexander N. Yakunin; Nikolay P. Aban'shin; Garif G. Akchurin; Georgy G. Akchurin; Yuri A. Avetisyan

doi:10.1117/12.2213218

14 March 2016 On the problems of stability and durability of field-emission current sources for electrovacuum devices

Alexander N. Yakunin, Nikolay P. Aban'shin, Garif G. Akchurin, Georgy G. Akchurin, Yuri A. Avetisyan

Proceedings Volume 9746, Ultrafast Phenomena and Nanophotonics XX; 974620 (2016) https://doi.org/10.1117/12.2213218
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

The results of the practical implementation of the concept of field-emission current source with high average current density of 0.1-0.3 A-cm^-2 are shown. The durability of cathode samples at a level of 6000 hours is achieved under conditions of technical vacuum. A phenomenological model is suggested that describes the tunneling of both equilibrium and nonequilibrium electrons in a vacuum from the zone of concentration of electrostatic field. Conditions are discussed as the resulting increase in the emission current due to the connection mechanism of the photoelectric effect is thermodynamically favorable, that is not accompanied by an undesirable increase in the temperature of the local emission zone. It is shown that to ensure stability and durability of the cathode is also important to limit the concentration of equilibrium carriers using composite structures «DLC film on Mo substrate." This helps to reduce the criticality of the CVC. A possible alternative is to use a restrictive resistance in the cathode. However, this increases the heat losses and thus decreases assembly efficiency. The results of experimental studies of the structure showing the saturation of photoemission current component with an increase in operating voltage. This fact suggests the existence of an effective mechanism for control of emission at constant operating voltage. This is fundamentally important for the stabilization of field emission cathode, providing a reliability and durability. The single-photon processes and the small thickness DLC films (15-20 nm) provide high-speed process of control.

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Alexander N. Yakunin, Nikolay P. Aban'shin, Garif G. Akchurin, Georgy G. Akchurin, and Yuri A. Avetisyan "On the problems of stability and durability of field-emission current sources for electrovacuum devices", Proc. SPIE 9746, Ultrafast Phenomena and Nanophotonics XX, 974620 (14 March 2016); https://doi.org/10.1117/12.2213218

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