Development of a resistivity standard for polymeric materials used in photovoltaic modules

Michael D. Kempe; David C. Miller; Dylan L. Nobles; Keiichiro Sakurai; John Tucker; Jayesh G. Bokria; Tsuyoshi Shioda; Kumar Nanjundiah; Toshio Yoshihara; Jeff Birchmier; Oihana Zubillaga; John H. Wohlgemuth

doi:10.1117/12.2189662

23 September 2015 Development of a resistivity standard for polymeric materials used in photovoltaic modules

Michael D. Kempe, David C. Miller, Dylan L. Nobles, Keiichiro Sakurai, John Tucker, Jayesh G. Bokria, Tsuyoshi Shioda, Kumar Nanjundiah, Toshio Yoshihara, Jeff Birchmier, Oihana Zubillaga, John H. Wohlgemuth

Author Affiliations +

Proceedings Volume 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII; 956302 (2015) https://doi.org/10.1117/12.2189662
Event: SPIE Optics + Photonics for Sustainable Energy, 2015, San Diego, California, United States

Abstract

Photovoltaic (PV) modules, operate at high voltages and elevated temperatures, and are known to degrade because of leakage current to ground. Related degradation processes may include: electric/ionic corrosion, electrochemical deposition, electromigration, and/or charge build-up in thin layers. The use of polymeric materials with a high resistivity is known to reduce the rate of potential induced degradation processes. Because of this, PV materials suppliers are placing increased importance on the encapsulant bulk resistivity, but there is no universally accepted method for making this measurement. The development of a resistivity test standard is described in this paper. We have performed a number of exploratory and round-robin tests to establish a representative and reproducible method for determining the bulk resistivity of polymeric materials, including encapsulation, backsheet, edge seals, and adhesives. The duration of measurement has been shown to greatly affect the results, e.g., an increase as great as 100X was seen for different measurement times. The standard has been developed using measurements alternating between an "on" and "off" voltage state with a weighted averaging function and cycle times of an hour.

Citation Download Citation

Michael D. Kempe, David C. Miller, Dylan L. Nobles, Keiichiro Sakurai, John Tucker, Jayesh G. Bokria, Tsuyoshi Shioda, Kumar Nanjundiah, Toshio Yoshihara, Jeff Birchmier, Oihana Zubillaga, and John H. Wohlgemuth "Development of a resistivity standard for polymeric materials used in photovoltaic modules", Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 956302 (23 September 2015); https://doi.org/10.1117/12.2189662

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available