Paper
20 May 2009 Study on location method with testing interferometric data of circle optical components
Wei Chen, Guang-kuan Zhou, Yan-ying Ju, Bin Fan, Yong-jian Wan
Author Affiliations +
Abstract
As a rule, Interferometers are used to test the Figure in the polishing phase of optical components. It could provide advance tutor suggestion for manufacturing. Various spatial points on the testoptical components will be given by interferogram analysis. Binary image is got from raw data. The edge of optical component is differentiated with a sobel exactly. A coefficient constraint condition is incorporated into the least squares method for geometric parameters of circles.The center coordinates and size of radius will be calculated by the method, and then the coordinate of the interferogram could be erected exactly.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Chen, Guang-kuan Zhou, Yan-ying Ju, Bin Fan, and Yong-jian Wan "Study on location method with testing interferometric data of circle optical components", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834K (20 May 2009); https://doi.org/10.1117/12.828830
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KEYWORDS
Optical components

Optical testing

Binary data

Optics manufacturing

Data centers

Polishing

Interferometry

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