Paper
20 May 2009 Spectral-domain optical coherence tomography (SD-OCT) with a thermal light source
Yuping Chen, Hong Zhao, Zhao Wang, Chunying Deng, Bin Yu
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Abstract
Optical coherence tomography (OCT), as a noninvasive imaging technique, has been widely applied in biological and medical fields. The light sources commonly used in OCT are the partially coherent light sources which usual exhibits typically the resolution of 15 to 20 μm. In another approach for an extremely broadband light source is a thermal light source (white light), which may have the potential to supply a compact and low-cost OCT system. In addition, current the majority of OCT measurements are executed in the time domain systems, which are limited in the image acquisition rate and sensitivity. However, a spectral domain optical coherence tomography system (SD-OCT) outperforms the conventional TD-OCT system in imaging acquisition rate and sensitivity. In order to improve both image acquisition rate and axial resolution economically, a white light source spectral-domain optical coherence tomography (SD-OCT) system is constructed, where a tungsten halogen lamp is chosen as the illumination source and a Michelson fiber interferometer is employed to generate interference pattern of object collected by a spectrometer. The object inner structure is obtained from the interference pattern by a Fourier transform. It is theoretically stated and experimentally verified that the white light source SD-OCT system is feasible and enables to realize near real time three dimensional imaging reconstructions of internal structure of engineering and biological materials.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuping Chen, Hong Zhao, Zhao Wang, Chunying Deng, and Bin Yu "Spectral-domain optical coherence tomography (SD-OCT) with a thermal light source", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72833J (20 May 2009); https://doi.org/10.1117/12.828777
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KEYWORDS
Light sources

Optical coherence tomography

Imaging systems

Light

Thin films

Halogens

Interferometers

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