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Laser diode reliability depends on both power and spectral stability over time. This report examines cases in which both
corrosion and ionic deposition resulted in wavelength shifts from less than 1 nm to greater than 7 nm in 60 - 100W bars
on microchannel coolers. Both corrosion and deposition seemed to be exacerbated by frequent and/or lengthy periods of
stagnation in the DI water system. Analytical results including SEM images of FIB cross-sections illustrate deposits of
up to several microns thickness of dielectric (oxide) material, as well as voiding caused by corrosion of Ni-plating out
from under Au-plating through pinhole defects. Thermal modeling confirms the effect of such features on thermal
resistance, correlating to observed wavelength shifts. Actions taken to address these issues are discussed.
David R. Balsley,David C. Dawson,Ryan Johnson, andRobert J. Martinsen
"Long-term wavelength stability of high-power laser diode bars on microchannel coolers", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71980J (23 February 2009); https://doi.org/10.1117/12.809925
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David R. Balsley, David C. Dawson, Ryan Johnson, Robert J. Martinsen, "Long-term wavelength stability of high-power laser diode bars on microchannel coolers," Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71980J (23 February 2009); https://doi.org/10.1117/12.809925