Paper
3 September 2008 Two-band IR sensing technology with improved temperature and spatial resolution: visualizing light and heat in LEDs
Volodymyr Malyutenko, Oleg Malyutenko
Author Affiliations +
Abstract
Infrared imaging in the 3-5 and 8-12 μm bands is demonstrated to be extremely fast and spatially resolved characterization technology for testing light and heat in micron-size light emitting devices. It is shown how this high-speed contactless technology coupled with the CCD micro vision can be used to monitor both light and parasitic heat evolution in space (10-μm resolution step) and time (~10 μs temporal scale) in white, near IR, mid-wave IR, and long-wave IR LEDs. The technology appears to be the best way to find out if and where the excess heat emerges and how it affect on the light pattern and device performance. We experimentally demonstrate the non-uniformity in light pattern and local heat traps with giant temperature gradients (>103 K/cm), which affect LED parameters and cause these devices to degrade.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Volodymyr Malyutenko and Oleg Malyutenko "Two-band IR sensing technology with improved temperature and spatial resolution: visualizing light and heat in LEDs", Proc. SPIE 7055, Infrared Systems and Photoelectronic Technology III, 70550I (3 September 2008); https://doi.org/10.1117/12.794850
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Light emitting diodes

Thermography

Infrared imaging

Lamps

Infrared cameras

Cameras

Mid-IR

Back to Top