Projected fringe profilometry using holographic techniques for large-scale measurements

Wei-Hung Su; Wei-Jen Chen; Hung-Jei Kao; Chia-Jeng Huang

doi:10.1117/12.618870

8 September 2005 Projected fringe profilometry using holographic techniques for large-scale measurements

Wei-Hung Su, Wei-Jen Chen, Hung-Jei Kao, Chia-Jeng Huang

Proceedings Volume 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI; 59110Q (2005) https://doi.org/10.1117/12.618870
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

A technique using diffractive elements for finding the absolute shape of a large-scale object is proposed. It is found that an accurate projected fringe profilometer can be built by applying the holographic technique in the system. The advantages of using the presented technique for projected fringe profilometry are: (1) a large depth of field; (2) very fringe distortion (even for a large field of view); and (3) a very compact design for the measurement system.

Citation Download Citation

Wei-Hung Su, Wei-Jen Chen, Hung-Jei Kao, and Chia-Jeng Huang "Projected fringe profilometry using holographic techniques for large-scale measurements", Proc. SPIE 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI, 59110Q (8 September 2005); https://doi.org/10.1117/12.618870

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