Nonuniformity correction of a resistor array infrared scene projector

Eric M. Olson; Robert Lee Murrer Jr.

doi:10.1117/12.352919

19 July 1999 Nonuniformity correction of a resistor array infrared scene projector

Proceedings Volume 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV; (1999) https://doi.org/10.1117/12.352919
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

At the Kinetic-kill vehicle Hardware-in-the-Loop Simulator (KHILS) facility located at Eglin AFB, Florida, a technology has been developed for the projection of scenes to support hardware-in-the-loop testing of infrared seekers. The Wideband Infrared Scene Projector program is based on a 512 X 512 VLSI array of 2 mil pitch resistors. A characteristic associated with these projectors is each resistor emits measurably different in-band radiance when the same voltage is applied. Therefore, since it is desirable to have each resistor emit the same for a commanded radiance, each resistor requires a Non-Uniformity Correction (NUC). Though this NUC task may seem simple to a casual observer, it is, however, quite complicated. A high quality infrared camera and well-designed optical system are prerequisites to measuring each resistor's output accurately for correction. A technique for performing a NUC on a resistor array has been developed and implemented at KHILS that achieves a NUC (standard deviation output/mean output) of less than 1 percent. This paper presents details pertaining to the NUC system, procedures, and results.

Citation Download Citation

Eric M. Olson and Robert Lee Murrer Jr. "Nonuniformity correction of a resistor array infrared scene projector", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352919

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