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Kinetic energy weapon (KEW) programs under the Ballistic Missile Defense Office (BMDO) need high fidelity, fast framing infrared (IR) imaging seekers. As imaging sensors have matured to support BMDO, the complexity of functions assigned to the KEW weapon systems has amplified the necessity for robust hardware-in-the-loop (HWIL) simulation facilities to reduce program risk. The IR projector, an integral component of a HWIL simulation, must reproduce the real world with enough fidelity that the unit under test's (UUT) software will respond to the projected scenario of images as though it were viewing the real world. The CMOS resistor array IR scene projector, a wideband flickerless technology, shows great promise in cryogenic vacuum chamber as well as room temperature testing. A 128 X 128 CMOS resistor array has undergone extensive characterization measurements at Eglin AFB to determine its potential for HWIL testing of BMDO IR seekers. This paper addresses the nonuniformity correction (NUC) and use of the array in a calibrated projection test. The methodology and process for the NUC is described. Sensitivities to such things as output averaging, and optical sampling are explained. With the NUC procedure established, a test was accomplished that provided calibrated scene radiance values to a UUT. Absolute radiance values were not projected. Rather, the array's low and high output capabilities were equated to the low and high radiance values of an input scene. A calibration curve was established that allowed the UUT's output to be equated to the input scene's radiance values. The input scene was projected to the UUT, and the scene's radiance values were reproduced after applying the calibration curve to the UUT's output response. To the authors' knowledge, this if the first accomplishment of such a test with a dynamic IR scene projector.
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